1975
DOI: 10.1007/bf01031865
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Interstitial condensation in n+ GaAs

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Cited by 34 publications
(7 citation statements)
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“…Another possible mechanism for forming carbon interstitials through the agency of nitrogen impurity could be analogous to the chemico-electronic one proposed by Hurle (1979) for the formation of gallium interstitials in gallium arsenide doped with tellurium. Interstitial dislocation loops have been observed in this material after it has been heat-treated for 10 h at a temperature of 900 °C (Hutchinson & Dobson 1974) and while there was a suggestion that they might have arisen from quenched-in interstitials (Hutchinson & Dobson 1975), they are now thought to be due to impurities such as Te or Zn producing interstitials (Ball et al 1981). As far as is known to the author, all the observations of interstitial aggregates forming in materials of a single atomic species have involved the action of irradiation to produce the self-interstitials.…”
Section: Plateletsmentioning
confidence: 83%
“…Another possible mechanism for forming carbon interstitials through the agency of nitrogen impurity could be analogous to the chemico-electronic one proposed by Hurle (1979) for the formation of gallium interstitials in gallium arsenide doped with tellurium. Interstitial dislocation loops have been observed in this material after it has been heat-treated for 10 h at a temperature of 900 °C (Hutchinson & Dobson 1974) and while there was a suggestion that they might have arisen from quenched-in interstitials (Hutchinson & Dobson 1975), they are now thought to be due to impurities such as Te or Zn producing interstitials (Ball et al 1981). As far as is known to the author, all the observations of interstitial aggregates forming in materials of a single atomic species have involved the action of irradiation to produce the self-interstitials.…”
Section: Plateletsmentioning
confidence: 83%
“…The above mentioned phenomena seem to correspond to the behaviour of GaAs doped with Si [28], Se [26,27] and S [29] as well. On the contrary, Zn doping gives neither loops nor stacking faults, even at concentrations above 1019 at.cm-3 [26,27,29].…”
Section: Microstructure Of Annealed Doped Crys-mentioning
confidence: 97%
“…TALS. -After annealing at various temperatures, the defects present in Te doped GaAs single crystals display different behaviours [23,24,26,27], which are schematically represented in figure 4 : (i) below 400 °C and above 1 080 °C, no loop and (ii) annealing at temperatures between 800 °C and 1 000 °C causes the growth of vacancy loops in { 111 } and {110} planes ; their size increases with temperature. Isolated stacking faults are also observed.…”
Section: Microstructure Of Annealed Doped Crys-mentioning
confidence: 99%
“…for the temperature range of concern,it is not unreasonable to find a larger TA is required for extrinsic loops formed of Si interstitials. (47 ) Silicon has a diamond structure with a lattice parameter of 5.43 which is close to that of GaAs and hence layers of Si could be easily accomodated in the GaAs lattice.…”
Section: Discussionmentioning
confidence: 99%