We successfully identified native point defects that occur in Bi 2 Te 3 crystals by combining high-resolution bias-dependent scanning tunneling microscopy and density functional theory based calculations. As-grown Bi 2 Te 3 crystals contain vacancies, antisites and interstitial defects that may result in bulk conductivity and therefore may change the insulating bulk character. Here, we demonstrate the interplay between the growth conditions and the density of different types of native near-surface defects. In particular, scanning tunneling spectroscopy reveals the dependence on not only the local atomic environment, but also on the growth kinetics and the resulting sample doping from n-type towards intrinsic crystals with the Fermi level positioned inside the energy gap. Our results establish a bias-dependent STM signature of the Bi 2 Te 3 native defects and shed light on the link between the native defects and the electronic properties of Bi 2 Te 3 , which is relevant for the synthesis of topological insulator materials and the related functional properties.
Keywordstopological insulators, Bi 2 Te 3 , native point defects, scanning tunneling microscopy, density functional theory Topological insulators (TIs) represent one of the most active areas of quantum technology related research in condensed matter physics the last couple of years. The intense interest in TI materials soon after their theoretical prediction and experimental confirmation is justified as they realize a new electronic phase with promising applications ranging from advanced electronic and spintronic devices to quantum computing. The topological surface states (TSSs) of a three-dimensional TI provide robust conduction on the surface while the bulk is insulating. The low-energy electronic properties of these TSSs are dominated by massless Dirac fermion excitations, where the emerging Dirac cone defines the energy dispersion relations. Furthermore, a spin-momentum locking property is acquired due to spin-orbit interaction and time reversal symmetry that is present in these materials. As a result, backscattering from non-magnetic impurities is not allowed in TIs. [1][2][3][4][5][6][7][8][9][10][11] However, these fascinating properties experience many challenges caused by intrinsic point defects that exist naturally in binary tetradymites, including Bi 2 Te 3 and Bi 2 Se 3 . 12 Bi antisite defects denoted as Bi Te , Te antisite defects denoted as Te Bi , and Te vacancies denoted as V Te , are native defects with low formation energies that dope Bi 2 Te 3 crystals, which in turn exhibit bulk conductance that overshadows the TSSs. [13][14][15][16] On the other hand, identifying and investigating the impact of such native point defects close to the surface of the Bi 2 Te 3 is critical for improving the sample quality and the TI electronic properties necessary for TI-based