Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
7
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(7 citation statements)
references
References 25 publications
0
7
0
Order By: Relevance
“…Two t-EBSD mappings were done on the same area from both sample sides. As t-EBSD provides the crystallographic information from the area near the exit surface of the transmitted electrons (Keller & Geiss, 2012;Brodusch et al, 2013aBrodusch et al, , 2013bSuzuki, 2013) these two scans yield the crystallographic mapping of both opposing surfaces (see Fig. 2a).…”
Section: Microstructure Characterization Of Thin Auag Foilmentioning
confidence: 99%
See 3 more Smart Citations
“…Two t-EBSD mappings were done on the same area from both sample sides. As t-EBSD provides the crystallographic information from the area near the exit surface of the transmitted electrons (Keller & Geiss, 2012;Brodusch et al, 2013aBrodusch et al, , 2013bSuzuki, 2013) these two scans yield the crystallographic mapping of both opposing surfaces (see Fig. 2a).…”
Section: Microstructure Characterization Of Thin Auag Foilmentioning
confidence: 99%
“…Transmission electron backscatter diffraction (t-EBSD) is a recent technique for microstructural analysis and it is based on the collection of Kikuchi diffraction patterns generated by the transmitted electrons in a scanning electron microscope (SEM). A key point is that the resolution is enhanced over the resolution achieved through standard EBSD mode (Keller & Geiss, 2012;Suzuki, 2013;Brodusch et al, 2013aBrodusch et al, , 2013b. The advent of this method has led to a multiple nomenclature like SEM transmission Kikuchi diffraction (Trimby, 2012) and also transmission electron forward scattered diffraction (Brodusch et al, 2013a(Brodusch et al, , 2013b.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…Finally, a crucial use of Monte Carlo simulations is to perform accurate elemental quantification from energy-dispersive spectroscopy (EDS) data. Matrix correction factors can be computed using Monte Carlo simulations and then used to calculate accurate compositional information from X-ray intensities [911]. This allows quantification to be done without the need for standards or pre-measured experimental databases [10].…”
Section: Introductionmentioning
confidence: 99%