Introduction to non-destructive material characterizations

Caamiño, Adrian Keith; Otsuki, Akira

doi:10.1016/b978-0-323-91150-4.00014-8

Cited by 2 publications

(2 citation statements)

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“…This method is designed around a series of steps involving Fourier transformation, extinction position identification, the construction of extinction diffraction wave functions, filtering, lattice image reconstruction, and real image comparison analysis. Additionally, this study provides theoretical derivations for this method based on phase contrast dynamics [8,16] and high-resolution imaging principles, establishing its theoretical foundation.…”

Section: Introductionmentioning

confidence: 96%

“…The high-resolution transmission electron microscope (HRTEM) is a widely used technique for characterizing the microstructures of materials [1][2][3][4][5][6][7]. It is an imaging technique that is based on the phase contrast principle [8] and comprises two fundamental processes: the incident electron beam scatters after passing through a thin crystal specimen and undergoes Fourier transformation in the back focal plane of the objective lens, forming a diffraction pattern that carries crystal structure information. Subsequently, interference between the transmitted beam and multiple diffracted beams occurs, leading to Fourier inverse transformation to reconstruct high-resolution images of the crystal structure in the image plane of the objective.…”

Section: Introductionmentioning

confidence: 99%

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The Construction of a Lattice Image and Dislocation Analysis in High-Resolution Characterizations Based on Diffraction Extinctions

Ni,

Wang,

Guo

et al. 2024

Materials

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This paper introduces a method for high-resolution lattice image reconstruction and dislocation analysis based on diffraction extinction. The approach primarily involves locating extinction spots in the Fourier transform spectrum (reciprocal space) and constructing corresponding diffraction wave functions. By the coherent combination of diffraction and transmission waves, the lattice image of the extinction planes is reconstructed. This lattice image is then used for dislocation localization, enabling the observation and analysis of crystal planes that exhibit electron diffraction extinction effects and atomic jump arrangements during high-resolution transmission electron microscopy (HRTEM) characterization. Furthermore, due to the method’s effectiveness in localizing dislocations, it offers a unique advantage when analyzing high-resolution images with relatively poor quality. The feasibility of this method is theoretically demonstrated in this paper. Additionally, the method was successfully applied to observed edge dislocations, such as 1/6[211−], 1/6[2−11−], and 1/2[01−1], which are not easily observable in conventional HRTEM characterization processes, in electro-deposited Cu thin films. The Burgers vectors were determined. Moreover, this paper also attempted to observe screw dislocations that are challenging to observe in high-resolution transmission electron microscopy. By shifting a pair of diffraction extinction spots and superimposing the reconstructed images before and after the shift, screw dislocations with a Burgers vector of 1/2[011−] were successfully observed in electro-deposited Cu thin films.

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Section: Introductionmentioning

confidence: 96%