We have designed a gripper for scanning microwave microscopy based on atomic force microscopy, which is optimized for impedance-matching structures and high-frequency microwave losses. The gripper is simple in structure and highly integrated. The return loss near the target operating frequency of 20 GHz is less than -30 dB, with a good -3 dB bandwidth. The minimum detected power can reach -40 dBm with a power resolution of the order of nW. Microwave scanning image of the sample surface structure was experimentally tested, showing that the gripper can be applied to microwave scanning imaging. The research results have contributed to the development of scanning microwave microscopy.