1999
DOI: 10.1068/htec135
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Inverse analysis for the measurement of thermal properties of hard coatings

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Cited by 4 publications
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“…A significant number of papers have already addressed the problem of identifiability regarding the parameters of a coating in the course of a photothermal measurement, with periodic excitation [2][3][4][5] , pulsed excitation [6][7][8][9][10][11][12] or both 13 . Of benefit are also some works on the thermal characterization of a given layer in a multilayer stacking [14][15][16] .…”
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“…A significant number of papers have already addressed the problem of identifiability regarding the parameters of a coating in the course of a photothermal measurement, with periodic excitation [2][3][4][5] , pulsed excitation [6][7][8][9][10][11][12] or both 13 . Of benefit are also some works on the thermal characterization of a given layer in a multilayer stacking [14][15][16] .…”
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confidence: 99%
“…Applying the quadrupole formalism would have highlighted this feature much easier (see Ref. 17, 18 and applications 2,[5][6][7][8][9][10][11][13][14][15][16] ). As a matter of fact, when deprived from internal sources, the layer contribution is fully represented by the quadrupole 17,18 :…”
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