2017
DOI: 10.1137/16m1088922
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Inverse Random Source Scattering for Elastic Waves

Abstract: Abstract. This paper is concerned with the direct and inverse random source scattering problems for elastic waves where the source is assumed to be driven by an additive white noise. Given the source, the direct problem is to determine the displacement of the random wave field. The inverse problem is to reconstruct the mean and variance of the random source from the boundary measurement of the wave field at multiple frequencies. The direct problem is shown to have a unique mild solution by using a constructive… Show more

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Cited by 51 publications
(43 citation statements)
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“…We refer to [17,19,20,24] for the uniqueness and stability theory. Further, several numerical approaches have been developed for shape or source reconstruction [3][4][5]7,10,11,18,[21][22][23][23][24][25]39,45]. For…”
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confidence: 99%
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“…We refer to [17,19,20,24] for the uniqueness and stability theory. Further, several numerical approaches have been developed for shape or source reconstruction [3][4][5]7,10,11,18,[21][22][23][23][24][25]39,45]. For…”
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confidence: 99%
“…Compute the indicator functional I Θ S (p) for all sampling points p ∈ Z. •(5). Plot the indicator functional I Θ S (p).5.…”
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confidence: 99%
“…Due to the extra challenge of randomness and uncertainties, little is known for the inverse random source scattering problems. In [9][10][11]16,27,28], the random source was assumed to be driven by an additive white noise. Mathematical modeling and numerical computation were proposed for a class of inverse source problems for acoustic and elastic waves.…”
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confidence: 99%
“…The corresponding stability analysis was conducted by Li and Yuan in [12,13] with multifrequencies data. Recently Bao et al investigated forward and inverse random source problems for elastic wave equations in [3]. Moreover, an inverse random source problem of the Euler-Bernoulli equation is utilized by Bao et al [5] to determine the unknown material properties, especially for those nanostructures, whose scale are from 1 to 100 nm.…”
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confidence: 99%