Investigating spintronics thin film systems with synchrotron radiation

Schneider, Claus M.; Krug, I.; Müller, Martina; Matthes, Frank; Kaiser, Alexander; Wiemann, C.; Cramm, S.; Elmers, H. J.; Wegelin, F.; Krasyuk, A.; Nepijko, S. A.; Schönhense, G.

doi:10.1016/j.radphyschem.2009.02.013

Search citation statements

Order By: Relevance

Paper Sections

Select...

Exchange Scattering Polarimetry1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2014

2016

Publication Types

Select...

Book3

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

(1 citation statement)

References 33 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Very good spin sensitivity (S eff between 0.2 and 0.4), energy, and angular resolution (DE~7.5 meV and Dy~AE0. 18 , respectively) have been achieved. A FOM of 1.9 AE 0.2 Â 10 À2 was reported [65].…”

Section: Exchange Scattering Polarimetrymentioning

confidence: 91%

Spin-Resolved Valence Photoemission

Seddon

2014

Handbook of Spintronics

View full text Add to dashboard Cite

Spin-resolved valence photoemission has recently seen a resurgence of interest fostered by exciting results in a range of interesting materials. Reviewed here are the basics of, the instrumentation for, and techniques useful in spin-resolved photoemission, together with illustrative examples of its utilization for materials of general importance and of particular relevance to spintronics applications. The example materials are broadly classified into nonmagnetic and magnetic systems. The former covers Rashba systems and topological insulators. The latter includes thin films, half-metals, adsorbates and induced moments, and, finally, a short section on imaging. The review is not intended to be comprehensive in its coverage but rather to provide an introduction to hardware and techniques together with an overview of selected results and state-of-the-art developments. List of Abbreviations 1DOne

show abstract

Section: Exchange Scattering Polarimetrymentioning

confidence: 91%