2020
DOI: 10.1016/j.apsusc.2019.145043
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Investigating the effect of sulphurization on volatility of compositions in Cu-poor and Sn-rich CZTS thin films

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Cited by 25 publications
(31 citation statements)
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“…XPS spectra binding energies were corrected using the C1s standard peak at 284.6 eV. [ 36 ] The deconvolution and peak fitting were carried out using the software “ XPSPEAK41 ”. The FWHM is kept constant during the peak fitting for each of the doublets of a core spectrum.…”
Section: Methodsmentioning
confidence: 99%
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“…XPS spectra binding energies were corrected using the C1s standard peak at 284.6 eV. [ 36 ] The deconvolution and peak fitting were carried out using the software “ XPSPEAK41 ”. The FWHM is kept constant during the peak fitting for each of the doublets of a core spectrum.…”
Section: Methodsmentioning
confidence: 99%
“…The FWHM is kept constant during the peak fitting for each of the doublets of a core spectrum. [ 36 ] Low magnification scanning transmission electron microscopy (STEM) was performed using a Thermo Fisher Osiris microscope operated at 200kV equipped with a Super‐X detector. The specimen for the TEM study was prepared using the focused ion beam (FIB) technique, on a gold support.…”
Section: Methodsmentioning
confidence: 99%
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“…However, the current work enables the incorporation of S at chemical level, avoiding the sulphurization stage and the premature S volatilization, permitting an effective incorporation in the structure of CZTS. Such procedure, allows to evaluate the volatility of Sn with respect to other components and the subsequent understanding of how hydrothermal synthesis route affect the electrical behavior of samples, in accordance with Vishwakarma et al 36 .…”
Section: X-ray Diffraction Analysesmentioning
confidence: 62%