2023
DOI: 10.1007/s42341-023-00444-w
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Investigating the Effects of Channel Length and High-K Dielectric Materials on the Performance of Double-Gate MOSFETs

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“…However, if the gate length scale is being executed, the drive continues to decrease the dielectric stack's thickness. 6 Comprehending the basic processes for dependability provides mitigation through process adjustments and an improvement in performance, operating voltage (Vmax), and reliability. In order to improve performance with a lower leakage current, the high-k dielectric medium which includes silicon nitrate and hafnium dioxide is employed in the proposed n-MOSFET.…”
mentioning
confidence: 99%
“…However, if the gate length scale is being executed, the drive continues to decrease the dielectric stack's thickness. 6 Comprehending the basic processes for dependability provides mitigation through process adjustments and an improvement in performance, operating voltage (Vmax), and reliability. In order to improve performance with a lower leakage current, the high-k dielectric medium which includes silicon nitrate and hafnium dioxide is employed in the proposed n-MOSFET.…”
mentioning
confidence: 99%