Investigating the probe-tip influence on imaging using scanning near-field optical microscopy

Achmari, Panji; Siddiquee, Arif M.; Si, Guangyuan; Lin, Jiao; Abbey, Brian

doi:10.1364/osac.415810

Cited by 5 publications

(1 citation statement)

References 38 publications

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“…The AFM probe serves as an optical antenna to convert nanostructured near fields formed by probe-object interactions to the propagating away (towards a remote detector) far-field components. In addition, a sharp probe, which is usually made of metal-coated semiconductor (silicon Si) [13], provides strongly confined and enhanced electrical fields that interrogate the sample surface enabling thereby subwavelength resolution [14,15]. The electric field confinement around the probe tip is determined by the curvature radius of the tip apex [16], which is of the order of 10-100 nm.…”

Section: Introductionmentioning

confidence: 99%

Dark-probe scanning near-field microscopy

Parsamyan,

Yezekyan,

Nerkararyan

et al. 2023

New J. Phys.

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Scanning near-field optical microscopy (SNOM) is a well-known powerful optical technique for visualization of surface nanostructures and fields far beyond the diffraction limit and thus indispensable in material- and nanoscience. While the SNOM resolution is theoretically unlimited, the SNOM performance is in practice constrained by the signal-to-background ratio, simply because of light scattering scaling down as the sixth power of a nanoparticle size and useful signals rapidly drowning in the background for very small objects. In modern instruments, this problem is usually ameliorated through advanced post-processing techniques. Here, we suggest using, instead or in parallel, a ‘dark’ SNOM probe designed to suppress the background light scattering, so that the scattering occurs only when the probe is very close to a nanoscopic object. We argue and demonstrate with simulations that the dark-probe SNOM imaging is much more sensitive to the presence of tiny nanoparticles or any other nanoscale features, allowing thereby for superior resolution and sensing capabilities that are invaluable for nano-optical characterization.

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Section: Introductionmentioning

confidence: 99%

Dark-probe scanning near-field microscopy

Parsamyan,

Yezekyan,

Nerkararyan

et al. 2023

New J. Phys.

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Long-wave infrared super-resolution wide-field microscopy using sum-frequency generation

Niemann

Waßerroth

et al. 2022

Applied Physics Letters

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Super-resolution microscopy in the visible is an established powerful tool in various disciplines. In the long-wave infrared (LWIR) spectral range, however, no comparable schemes have been demonstrated to date. In this work, we experimentally demonstrate super-resolution microscopy in the LWIR range ([Formula: see text]m) using IR-visible sum-frequency generation. We operate our microscope in a wide-field scheme and image localized surface phonon polaritons in 4H-SiC nanostructures as a proof-of-concept. With this technique, we demonstrate an enhanced spatial resolution of [Formula: see text], enabling to resolve the polariton resonances in individual sub-diffractional nanostructures with sub-wavelength spacing. Furthermore, we show that this resolution allows us to differentiate between spatial patterns associated with different polariton modes within individual nanostructures.

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Microscopy of terahertz spoof surface plasmons propagating on planar metamaterial waveguides

Sulollari,

Park,

Salih

et al. 2024

APL Photonics

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Surface plasmon polaritons (SPPs) are electromagnetic waves that have attracted significant interest owing to their subwavelength confinement and the strong field enhancement that they provide. Yet in the terahertz (THz) frequency region of the spectrum, which is well below the plasma frequency of metals, these surface waves are characterized by extremely weak confinement that has severely limited their exploitation for information processing and sensing. One means to circumvent this limitation is through subwavelength structuring of a metallic surface, which can thereby be engineered to support the propagation of spoof surface plasmon polaritons (SSPPs) that closely mimic the properties of SPPs. In this work, we report the design and experimental characterization of an ultra-thin metamaterial planar waveguide that supports SSPPs at THz frequencies. Finite-element method simulations are shown to predict the excitation of SSPPs on the surface of our devices under free-space illumination at 3.45 THz. We investigate these structures experimentally using THz scattering-type scanning near-field microscopy (THz-s-SNOM) to map directly the out-of-plane electric field associated with the propagation of SSPPs on the surface of the waveguides. Our work paves the way for the future development of plasmonic integrated circuit technologies and components operating in the THz frequency band.

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Investigating the probe-tip influence on imaging using scanning near-field optical microscopy

Cited by 5 publications

References 38 publications

Dark-probe scanning near-field microscopy

Dark-probe scanning near-field microscopy

Long-wave infrared super-resolution wide-field microscopy using sum-frequency generation

Microscopy of terahertz spoof surface plasmons propagating on planar metamaterial waveguides

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