2017 International Conference on Noise and Fluctuations (ICNF) 2017
DOI: 10.1109/icnf.2017.7986020
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Investigation and simulation of voltage-noise characteristics of semiconductor barrier structures

T. A. Kholomina
1
,
V. G. Litvinov
2
,
А. Л. Семенов
3
et al.
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