“…In [4], SiC MOSFEts have shown high junction operation temperature capabilities (i.e., beyond 250 • C ) for long-term reliability, nevertheless, the short circuit capability has proven to be equivalent to its silicon counterparts. Additionally, the Short Circuit Safe Operation Area (SCSOA) of the latest discrete 1.2 kV SiC MOSFET devices have been lately investigated, evidencing a large variation between different manufacturers (i.e, typically Cree, Rohm, GE) [5]- [7] and testing conditions (i.e., DC link voltage, case temperature, and gate voltage) [8], [9], [13]. Other studies have focused on the development of an electro-thermal model for predicting the SCSOA, including failure time and simulated junction temperature at different testing conditions, such as those in [10], [14].…”