2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings 2006
DOI: 10.1109/icsict.2006.306607
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Investigation of annealing on Au/p-CdZnTe Contact

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“… 10 ). The CZT-metal contact is known to degrade at ~100 °C and above 11 12 causing increased leakage current of the detector and deterioration of its performance. In order to increase the throughput of fabricating high-quality detectors, we performed the AZO deposition process at a moderately low temperature of 85 °C.…”
Section: Resultsmentioning
confidence: 99%
“… 10 ). The CZT-metal contact is known to degrade at ~100 °C and above 11 12 causing increased leakage current of the detector and deterioration of its performance. In order to increase the throughput of fabricating high-quality detectors, we performed the AZO deposition process at a moderately low temperature of 85 °C.…”
Section: Resultsmentioning
confidence: 99%