Investigation of block depth distribution in PS-<i>b</i>-PMMA block copolymer using ultra-low-energy cesium sputtering in ToF-SIMS

Terlier, Tanguy; Tiron, Raluca; Gharbi, Ahmed; Chevalier, Xavier; Veillerot, M.; Martínez, E.; Barnes, Jean‐Paul

doi:10.1002/sia.5353

Cited by 17 publications

(15 citation statements)

References 13 publications

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“…[50][51][52][53][54][55][56][57] In these sources, argon gas clusters are formed as Ar atoms coalesce following a supersonic expansion, resulting in clusters with a tuneable cluster size in the range of a few 1000 atoms/cluster and several eV per atom. 58 Originally employed in SIMS depth profiling, GCIB sources have already found application in combination with XPS, 59,60 however only a handful of reports exist of their combination with UPS. Specifically, a comparison of UPS surface measurements performed using the 'layer by layer' method with UPS depth profiling using GCIB confirmed an essentially damage-free removal of thermally evaporated organic molecules.…”

Section: Introductionmentioning

confidence: 99%

Visualizing the Vertical Energetic Landscape in Organic Photovoltaics

Lami

Weu

Zhang

et al. 2019

Joule

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Energy level diagrams in organic electronic devices play a crucial role in device performance and interpretation of device physics. In the case of organic solar cells, it has become routine to estimate the photovoltaic gap of the donor:acceptor blend using the energy values measured on the individual blend components, resulting in a poor agreement with the corresponding open-circuit voltage of the device. To address this issue, we developed a method that allows a direct visualisation of the vertical energetic landscape in the blend, obtained by combining ultraviolet photoemission spectroscopy and argon cluster etching. We investigate both model and high-performance photovoltaic systems and demonstrate that the resulting photovoltaic gaps are in close agreement with the measured CT energies and open-circuit voltages. Furthermore, we show that this method allows us to study the evolution of the energetic landscape upon environmental degradation, critically important for understanding degradation mechanisms and development of mitigation strategies.

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Section: Introductionmentioning

confidence: 99%

Visualizing the Vertical Energetic Landscape in Organic Photovoltaics

Lami

Weu

Zhang

et al. 2019

Joule

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“…In particular, there is an increasing need for metrology to provide an accurate chemical characterization with 3D spatial resolution at the nanoscale. Providing such a high 3D spatial resolution is a challenging task and it has been the topic of many studies so far …”

Section: Introductionmentioning

confidence: 99%

Development and Synchrotron‐Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques

Dialameh

Lupi

Hönicke

et al. 2017

Physica Status Solidi (a)

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The continuous and aggressive scaling in semiconductor technology results in the integration of increasingly complex 3D architectures and new materials. The realization of these downscaled 3D structures requires also further improvement in 3D characterization techniques. In this work, a potential route to improve the accuracy and reliability of the quantitative analysis of 3D nano-devices is investigated. 3D organic and inorganic reference nanostructures with dimensions and structural ordering resembling those utilized in industrial applications are fabricated and characterized in detail. The 3D organic nanostructures are fabricated exploiting the selfassembly capability of di-block copolymers. Subsequent deposition of a thin Al film lead to the formation and realization of nanostructured Al. In addition, different inorganic nanostructures are fabricated using electron beam lithography. The various nanostructures are characterized with respect to their dimensions as well as composition using various analytical techniques namely reference-free grazing incidence X-ray fluorescence, grazing incidence small angle X-ray scattering, scanning electron microscopy, and spectroscopic ellipsometry. status solidi physica a Di-Block Copolymers www.pss-a.com

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“…Cs high reactivity ensures a negative ion signal enhancement, along with free radicals scavenging [18]. This source already proved its efficiency on both inorganics [19][20][21][22] and organics [23][24][25]. In this paper, we analyze model systems made of different metals (gold or chromium) and tyrosine multilayer systems deposited on silicon substrates.…”

Section: Introductionmentioning

confidence: 99%

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

Noël

Houssiau

2016

J. Am. Soc. Mass Spectrom.

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Abstract. The structures developed in organic electronics, such as organic light emitting diodes (OLEDs) or organic photovoltaics (OPVs) devices always involve hybrid interfaces, joining metal or oxide layers with organic layers. No satisfactory method to probe these hybrid interfaces physical chemistry currently exists. One promising way to analyze such interfaces is to use in situ ion beam etching, but this requires ion beams able to depth profile both inorganic and organic layers. Mono-or diatomic ion beams commonly used to depth profile inorganic materials usually perform badly on organics, while cluster ion beams perform excellently on organics but yield poor results when organics and inorganics are mixed. Conversely, low energy Cs + beams (<500 eV) allow organic and inorganic materials depth profiling with comparable erosion rates. This paper shows a successful depth profiling of a model hybrid system made of metallic (Au, Cr) and organic (tyrosine) layers, sputtered with 500 eV Cs + ions. Tyrosine layers capped with metallic overlayers are depth profiled easily, with high intensities for the characteristic molecular ions and other specific fragments. Metallic Au or Cr atoms are recoiled into the organic layer where they cause some damage near the hybrid interface as well as changes in the erosion rate. However, these recoil implanted metallic atoms do not appear to severely degrade the depth profile overall quality. This first successful hybrid depth profiling report opens new possibilities for the study of OLEDs, organic solar cells, or other hybrid devices.

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Investigation of block depth distribution in PS-b-PMMA block copolymer using ultra-low-energy cesium sputtering in ToF-SIMS

Cited by 17 publications

References 13 publications

Visualizing the Vertical Energetic Landscape in Organic Photovoltaics

Visualizing the Vertical Energetic Landscape in Organic Photovoltaics

Development and Synchrotron‐Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

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