“…In common wheat, traits that are most correlated with lodging resistance are: plant height, stem length, stem diameter, stem and spike weight, stem wall thickness, and mechanical layer thickness (Kelbert et al, 2004a,b;Kong et al, 2013;Wang et al, 2006;Zuber et al, 1999). Recent studies investigated the correlations between lodging resistance and the concentrations of cellulose, lignin, pectin, and protein in the stem (Kong et al, 2013;Wang et al, 2012). Strong correlations between plant height and lodging resistance were noted in modern cultivars of common wheat by Kelbert et al (2004a,b), who studied the effects of artificially induced lodging on 13 and 25 genotypes of spring wheat, respectively.…”