2007
DOI: 10.1149/1.2720632
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of Charge Neutralization Behavior in Cu∕6FDA-PPD∕Si MIS Capacitors by Capacitance-Voltage Measurement

Abstract: In this work, the capacitance-voltage ͑C-V͒ characteristics of Cu/2,2Ј-bis-͑3,4-dicarboxyphenyl͒ hexafluoropropane dianhydride ͑6FDA͒-p-phenylene diamine ͑PPD͒/Si metal-insulator-semiconductor ͑MIS͒ capacitors after different annealing processes are investigated. During annealing ͑in N 2 + H 2 ambient and in vacuum͒, positive charges are generated in the capacitors and it leads to a shift of flatband voltage ͑V FB ͒ toward the negative-bias direction. However, the V FB of the annealed samples moves backward ͑t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 18 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?