Investigation of High Z Components Doped in Polymeric Films, Using 2π Configuration X‐Ray Fluorescence Technique

Abstract

Doping of a polymeric material involves incorporation of different reduction − oxidation agents into the host polymeric material, resulting in an increase in electrical conductivity, modification of optical properties and changes in microstructure of the polymeric material. The detection of high atomic number (Z) components in doped polymeric films is performed using Energy Dispersive X‐ray Fluorescence (EDXRF) technique in 2 π geometrical configuration. In order to study K shell (Kαβ) X‐rays emitted from the prepared films, thallium doped sodium iodide [NaI(Tl)] scintillator is used as the detector of X‐rays and cobalt‐57 radio‐isotope is used as the source of low energy gamma rays. Initially, the calibration data is recorded considering the different known concentrations of high Z element in a host polymeric matrix. This involves the identification of the X‐ray fluorescent peak of the metal/metal ion and use of stripping software to isolate the X‐ray fluorescence spectrum. The area under the fluorescence peak is determined, at each concentration level of dopant/filler. A calibration plot of area under the fluorescence peak versus known concentration of high Z component in the dopant/filler is plotted. This helps in the determination of unknown amount of that particular high Z‐component doped or filled in a host matrix. The different parameters involved in this measurement is discussed along with studies on polymeric composites doped with a salt/compound containing high Z‐components, namely bismuth subcarbonate in a host polymeric matrix (epoxy filled with graphite powder).