2010
DOI: 10.1016/j.apsusc.2009.10.018
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Investigation of initial growth and very thin () ZnO films by cross-sectional and plan-view transmission electron microscopy

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Cited by 9 publications
(1 citation statement)
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“…The normal to the film surface is [11][12][13][14][15][16][17][18][19][20] ZnO but this direction is not a principal axis of the sapphire structure. 28 In the selected area diffraction pattern in PV orientation (insert in Figure 5), (1-100) ZnO and (11)(12)(13)(14)(15)(16)(17)(18)(19)(20) sapphire diffraction spots are visible along one in-plane orientation whereas only the (0002) ZnO spot is visible along the perpendicular in-plane direction. Figure 5 also shows a PV dark field image using the (1-100) ZnO and (11-20) sapphire diffraction spots.…”
Section: Coalescence Of Nucleimentioning
confidence: 99%
“…The normal to the film surface is [11][12][13][14][15][16][17][18][19][20] ZnO but this direction is not a principal axis of the sapphire structure. 28 In the selected area diffraction pattern in PV orientation (insert in Figure 5), (1-100) ZnO and (11)(12)(13)(14)(15)(16)(17)(18)(19)(20) sapphire diffraction spots are visible along one in-plane orientation whereas only the (0002) ZnO spot is visible along the perpendicular in-plane direction. Figure 5 also shows a PV dark field image using the (1-100) ZnO and (11-20) sapphire diffraction spots.…”
Section: Coalescence Of Nucleimentioning
confidence: 99%