2001
DOI: 10.1016/s0169-4332(00)00804-7
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Investigation of micro-adhesion by atomic force microscopy

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Cited by 66 publications
(44 citation statements)
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“…Such a high adhesion force at the microscale will lead to setal jumping off during toe pad scrolling. This jump-off event is a common phenomenon that has been observed in many other systems such as atomic force microscope pull-off tests for measuring micro-/nano-adhesion [25,[27][28][29][30][31] and single carbon nanotube peeling tests [32,33].…”
Section: Gecko Detachment Mechanisms With and Without Digital Hyperexmentioning
confidence: 77%
“…Such a high adhesion force at the microscale will lead to setal jumping off during toe pad scrolling. This jump-off event is a common phenomenon that has been observed in many other systems such as atomic force microscope pull-off tests for measuring micro-/nano-adhesion [25,[27][28][29][30][31] and single carbon nanotube peeling tests [32,33].…”
Section: Gecko Detachment Mechanisms With and Without Digital Hyperexmentioning
confidence: 77%
“…The total adhesion force in presence of a meniscus will then be given by the sum of the meniscus force and the direct solid-solid contact adhesion. The relative contributions of meniscus, van der Waals and electrostatic force under ambient conditions (50% humidity) for the adhesion of an AFM tip to graphite, mica and MoS 2 were elucidated by Ouyang et al [681]. In all cases, the meniscus force was found to give the largest contribution.…”
Section: Meniscus Forcementioning
confidence: 99%
“…approximation is to consider only van der Waals interaction [28,29]. These forces are thus estimated at: …”
Section: Van Der Waals Forcesmentioning
confidence: 99%