Investigation Of Multi-Resolution Support For MeV Ion Microscopy Imaging

Abstract

To minimize the dose applied to the specimens during imaging in a MeV ion microbeam we have investigated new concepts that allow collection of images with multi-resolution support. To test the concept, a set of reference PIXE microbeam images with well-characterised noise were segmented using both a direct down-sampling technique and wavelet decomposition. The results show both techniques could be used to select fields of view with <2% of the fluence required to collect a normal image, however, there is no compelling reason to select one technique over the other.