2015
DOI: 10.1016/j.tsf.2015.05.012
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Investigation of selenization process of electrodeposited Cu–Zn–Sn precursor for Cu2ZnSnSe4 thin-film solar cells

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Cited by 7 publications
(3 citation statements)
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References 27 publications
(14 reference statements)
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“…The slight differences between the PL peak positions can occur due to different compositions, which may lead to different tailing properties and other dominating defects. The PL spectra from the backside of each absorber show additionally a broad peak at around 1.2 eV, known as a ZnSe defect transition in literature [30,[33][34][35]. These results are in good agreement with SE and Raman results: All samples show clear evidence for the existence of ZnSe secondary phases at the back side of the absorber for both SE and Raman spectroscopy (see Table 1 and Section 3.2).…”
Section: Photoluminescence Resultssupporting
confidence: 78%
“…The slight differences between the PL peak positions can occur due to different compositions, which may lead to different tailing properties and other dominating defects. The PL spectra from the backside of each absorber show additionally a broad peak at around 1.2 eV, known as a ZnSe defect transition in literature [30,[33][34][35]. These results are in good agreement with SE and Raman results: All samples show clear evidence for the existence of ZnSe secondary phases at the back side of the absorber for both SE and Raman spectroscopy (see Table 1 and Section 3.2).…”
Section: Photoluminescence Resultssupporting
confidence: 78%
“…However, the copper deposited on the molybdenum sublayer had bad adhesion in this work. A similar behavior of electrochemically deposited copper on a molybdenum layer was observed in [21,22]. Therefore, nickel was used as a sublayer for copper [23] and as a top layer to prevent the loss of volatile tin during subsequent high-temperature annealing.…”
Section: Synthesis Of Thin Filmsmentioning
confidence: 81%
“…También se observan grietas en superficie, aunque son muy finas y aparentemente no suponen un problema para la continuidad de la capa. [195]. A 21,9º (2θ) también se ha indexado un pico correspondiente a la fase Se6, la cual ha podido formarse en superficie durante el tratamiento de selenización (JSPDS 089-1617).…”
Section: Caracterización De Las Capas Precursorasunclassified