Investigation of single event effect in 28-nm system-on-chip with multi patterns*

Abstract

Single event effects (SEEs) in a 28-nm system-on-chip (SoC) were assessed using heavy ion irradiations, and susceptibilities in different processor configurations with data accessing patterns were investigated. The patterns included the sole processor (SP) and asymmetric multiprocessing (AMP) patterns with static and dynamic data accessing. Single event upset (SEU) cross sections in static accessing can be more than twice as high as those of the dynamic accessing, and processor configuration pattern is not a critical factor for the SEU cross sections. Cross section interval of upset events was evaluated and the soft error rates in aerospace environment were predicted for the SoC. The tests also indicated that ultra-high linear energy transfer (LET) particle can cause exception currents in the 28-nm SoC, and some even are lower than the normal case.

Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip

“…[9] Soft errors induced by alpha particles pose a critical threat to the reliability and operational lifespan of modern electronic systems. [10,11] Therefore, it is crucial to study SEE induced by alpha particle on CNN systems in order to develop its space applications. In this work, irradiation test and fault injection experiment are performed.…”