2009
DOI: 10.1016/j.matchemphys.2009.06.021
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Investigation of SR method grown 〈001〉 directed KDP single crystal and its characterization by high-resolution X-ray diffractometry (HRXRD), laser damage threshold, dielectric, thermal analysis, optical and hardness studies

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Cited by 27 publications
(3 citation statements)
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“…The XRD study indicates that the SR KDP crystal has good crystalline perfection compared to conventional KDP crystal. These conclusions are relatively consistent with Ramasamy's works [6,7,8,9] and Barati's work [17].…”
Section: Discussionsupporting
confidence: 89%
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“…The XRD study indicates that the SR KDP crystal has good crystalline perfection compared to conventional KDP crystal. These conclusions are relatively consistent with Ramasamy's works [6,7,8,9] and Barati's work [17].…”
Section: Discussionsupporting
confidence: 89%
“…Ramasamy et al [6,7] reported the KDP crystals grown by the SR method had damage thresholds higher than the conventional method grown crystals. The damage threshold was influenced by the dislocation in the KDP crystal, and the crystal with many dislocations presented low damage threshold [8]. These conclusions showed that the quality of the crystal grown by the SR method is better than conventional method grown crystal for optical device [9].…”
Section: Introductionmentioning
confidence: 86%
“…Negres et al concluded that the LID density has a distinct aggravation near the PY–PR boundary compared to other sectors of a “point-seed” rapidly grown KDP crystal. To avoid the formation of PY–PR boundaries during the rapid growth of KDP-type crystals, the Sankaranarayanan–Ramasamy (SR) method was proposed. , Although there is no PY–PR boundary in the crystals grown by the SR method, , the flow conditions of the solution in this method are worse than that of KDP crystal grown on a rotating platform, making it difficult to grow large-aperture KDP-type crystals.…”
Section: Introductionmentioning
confidence: 99%