2017
DOI: 10.3390/coatings7080115
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Investigation of Structural and Electronic Properties of CH3NH3PbI3 Stabilized by Varying Concentrations of Poly(Methyl Methacrylate) (PMMA)

Abstract: Abstract:Studies have shown that perovskites have a high potential of outdoing silicon based solar cells in terms of solar energy conversion, but their rate of degradation is also high. This study reports on improvement on the stability of CH 3 NH 3 PbI 3 by passivating it with polymethylmethacrylate (PMMA). Structural and electronic properties of CH 3 NH 3 PbI 3 stabilized by polymethylmethacrylate (PMMA) were investigated by varying concentrations of PMMA in the polymer solutions. Stability tests were perfor… Show more

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Cited by 9 publications
(5 citation statements)
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“…For example, an E t of 38 meV was found for the CH 3 NH 3 PbI 3 perovskite deposited on a layer of the TiO 2 whereas the value of 21 meV was reported for a double layer design by having TiO 2 with the organic fullerene derivatives . Awino et al showed the dependence of PMMA concentrations for stabilizing the CH 3 NH 3 PbI 3 . The values of E t were found to be in a range of 17–45 meV and were strongly dependent on the concentrations of PMMA being used.…”
Section: Resultsmentioning
confidence: 99%
“…For example, an E t of 38 meV was found for the CH 3 NH 3 PbI 3 perovskite deposited on a layer of the TiO 2 whereas the value of 21 meV was reported for a double layer design by having TiO 2 with the organic fullerene derivatives . Awino et al showed the dependence of PMMA concentrations for stabilizing the CH 3 NH 3 PbI 3 . The values of E t were found to be in a range of 17–45 meV and were strongly dependent on the concentrations of PMMA being used.…”
Section: Resultsmentioning
confidence: 99%
“…The diffraction peaks at 14.07, 20.18, 22.4, 24.45, 26.23, 31.6, 35.8, 43.12, and 49.8° are indexed to (110), (112), (121), (211), (220), (330), (132), (314), and (404) planes, which are characteristic of the tetragonal phase of MAPbI 3 . 36 , 68 Regarding the XRD of perovskite/GQD and perovskite/MGQD samples, the patterns show no diffraction peaks corresponding to GQD and MGQD owing to the small decoration. Moreover, the fwhm of the XRD pattern, especially the one centered at 26.23°, decreased in the order of pristine perovskite > perovskite/GQD > perovskite/MGQD, and based on the Scherrer equation, these changes demonstrated the modification in grain size and crystalline structure of perovskite film when it was incorporated with GQD and MGQD ( Figure 6 c).…”
Section: Resultsmentioning
confidence: 99%
“…67 To evaluate the effect of GQD and MGQD incorporation on the crystalline structure of the perovskite layer, XRD analysis was carried out on pristine perovskite, perovskite/GQD, and perovskite/MGQD samples, as shown in Figure 6a−c 132), (314), and (404) planes, which are characteristic of the tetragonal phase of MAPbI 3 . 36,68 Regarding the XRD of perovskite/GQD and perovskite/ MGQD samples, the patterns show no diffraction peaks corresponding to GQD and MGQD owing to the small decoration. Moreover, the fwhm of the XRD pattern, especially the one centered at 26.23°, decreased in the order of pristine perovskite > perovskite/GQD > perovskite/MGQD, and based on the Scherrer equation, these changes demonstrated the modification in grain size and crystalline structure of perovskite film when it was incorporated with GQD and MGQD (Figure 6c).…”
Section: Characterization Of Gqd-and Mgqd-doped Perovskite Filmsmentioning
confidence: 99%
“…In order to address the above‐mentioned limitations of vacuum‐based methods, flash evaporation and single‐source thermal evaporation methods are potentially being studied [2a,12,20] . However, low stability of hybrid perovskite films against atmospheric agents remains a challenge [21] which is addressed by various groups using various additives during film fabrication [22] or post deposition coating of perovskite films with a thin polymer layer [23] . Therefore, a simple and efficient vacuum‐based method is required to get phase pure perovskite thin films; where one can avoid the use of MAX and post‐deposition treatments to the thin film.…”
Section: Introductionmentioning
confidence: 99%
“…[2a,12,20] However, low stability of hybrid perovskite films against atmospheric agents remains a challenge [21] which is addressed by various groups using various additives during film fabrication [22] or post deposition coating of perovskite films with a thin polymer layer. [23] Therefore, a simple and efficient vacuum-based method is required to get phase pure perovskite thin films; where one can avoid the use of MAX and postdeposition treatments to the thin film. Herein, we demonstrate, a simple, facile and efficient vacuum-based method to fabricate perovskite thin films.…”
Section: Introductionmentioning
confidence: 99%