2007
DOI: 10.1016/j.tsf.2007.03.117
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Investigation of structural properties of ITO thin films deposited on different substrates

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Cited by 14 publications
(8 citation statements)
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“…peak significantly increases with a simultaneous reduction in the peak half width indicating the growth of the ITO particles with the increase in the calcination temperature. The peaks observed in the XRD pattern of the calcined sample at 550 C match well with the cubic In 2 O 3 peaks reported in the Joint Committee for Powder Diffraction Standards (JCPDS 6-416) 6. The calculated lattice parameters for the cubic ITO phase are 10.13 Å when compared with the reported lattice parameters of undoped In 2 O 3 , which is 10.118 Å 7.…”
supporting
confidence: 80%
“…peak significantly increases with a simultaneous reduction in the peak half width indicating the growth of the ITO particles with the increase in the calcination temperature. The peaks observed in the XRD pattern of the calcined sample at 550 C match well with the cubic In 2 O 3 peaks reported in the Joint Committee for Powder Diffraction Standards (JCPDS 6-416) 6. The calculated lattice parameters for the cubic ITO phase are 10.13 Å when compared with the reported lattice parameters of undoped In 2 O 3 , which is 10.118 Å 7.…”
supporting
confidence: 80%
“…29 A (222) preferential orientation of ITO was seen in thin films grown by thermal evaporation in vacuum. 30 However, the texture of ITO films depends on the deposition method and processing conditions. For example, magnetron sputtered and electron beam deposited ITO films on amorphous and crystalline Si substrates are usually amorphous in the as deposited state with the substrate being at room temperature (RT) during deposition, whilst they crystallize upon heat treatment and/or upon deposition at higher substrate temperatures.…”
Section: B Ito-si Interfacesmentioning
confidence: 99%
“…Another notable feature was the evolution of the interface width as a function of deposition temperature, where valleys, mountains, and island clusters become larger as the temperature increases. The increment in the grain size may be responsible for decreased optical scattering [35], and consequently increased transmittance that is detected in the reported case for the ITO films prepared at the higher substrate temperature.…”
Section: Surface Topography Analysis By Atomic Force Microscopymentioning
confidence: 55%