Possible grain boundary structures and distributions in monoclinic zirconia are discussed. Crystallogeometrical analysis was employed to evaluate some special, low-energy boundaries in the material. A computer simulation was then used to model the grain boundary misorientation and character distributions based on certain assumptions about crystallographic texture and orientation correlations which influence the formation of low-energy grain boundaries. The possible relevance of the results obtained to optimization of the protective properties of zirconia films is discussed.