“…In this paper, three plasma deposited films As x Te 100–x are characterized based on using the AOEM and T ( λ = 300 to 3000 nm), accounting for the significant glass substrate absorption for λ > 2500 nm hindering accurate characterization. Description of the preparation and some composition–structure–property relationships for these glassy films were reported in [ 38 ], however data about their characteristics , ∆d, n ( λ ), and k ( λ ) have not been published, as As x Te 100–x films are insufficiently studied, in general. A simple approach is also proposed and employed for increasing the accuracy of computation of the extinction coefficient k ( λ ) of thin films, in comparison with its commonly used computation from T + ( λ ).…”