2022
DOI: 10.32603/1993-8985-2022-25-6-79-89
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Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry

Abstract: Introduction. Optical backscatter reflectometry is one of the most promising methods used to examine characteristic parameters relevant to the design of microring resonators. This method paves the way for experimental determination of the coupling coefficient and propagation loss. However, experimental verification of this technique by comparing the transmission characteristics obtained by reflectometry and those directly measured by an optical vector analyzer has not been carried out.Aim. To determine the par… Show more

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