2016
DOI: 10.1039/c6cp00260a
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Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy – a comparative study

Abstract: Modifications at the CIGSe/CdS interface due to KF-PDT are studied using synchrotron radiation.

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Cited by 26 publications
(10 citation statements)
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“…Different from the behavior of Ga, In, and Se, we find a strong reduction of the Cu 2p signal on the ZSW absorber surface after RbF PDT. This is in accordance with other studies observing such a reduction in Cu content at the CIGSSe surface after KF PDT, but in contrast to studies suggesting a complete KF PDT‐induced removal of Cu from the surface . Besides these changes of the surface stoichiometry, K or (in the ZSW case) Rb is observed on the absorber surface after PDT, while a reduction of Na occurs (see Figure and refs.…”
Section: The Chemical Structure Of Thin‐film Solar Cell Surfaces and supporting
confidence: 92%
“…Different from the behavior of Ga, In, and Se, we find a strong reduction of the Cu 2p signal on the ZSW absorber surface after RbF PDT. This is in accordance with other studies observing such a reduction in Cu content at the CIGSSe surface after KF PDT, but in contrast to studies suggesting a complete KF PDT‐induced removal of Cu from the surface . Besides these changes of the surface stoichiometry, K or (in the ZSW case) Rb is observed on the absorber surface after PDT, while a reduction of Na occurs (see Figure and refs.…”
Section: The Chemical Structure Of Thin‐film Solar Cell Surfaces and supporting
confidence: 92%
“…In this context, the postdeposition processes involving KF have been shown to cause a Cu-and Ga-depleted surface region [3], [6]. The surface region is thought to facilitate the in-diffusion of cadmium and consequently the formation of Cd Cu donor levels during the deposition of CdS [3], [7], [8]. Furthermore, the NaF + KF PDT also induces a band gap widening at the absorber surface [6], [9].…”
Section: Influence Of Sodium and Rubidium Postdeposition Treatment Onmentioning
confidence: 99%
“…Studies concerning the electronic structure of the CIGS surface and CIGS/CdS interface using ultraviolet photoelectron spectroscopy (UPS) and X‐ray photoelectron spectroscopy (XPS) as well as inverse photoemission spectroscopy (IPES) measurements have been given as a result of the downward shift of the valence band maximum (VBM) at the absorber surface after PDT . Contradictory results were also reported; in the case of KF, an upward shift of the VBM was derived from hard X‐ray photoelectron spectroscopy (HAXPES). Similar discrepancy has also occurred while comparing the conduction band minimum (CBM) between untreated/treated PDT samples .…”
Section: Introductionmentioning
confidence: 99%