Investigation of the production mechanism of parametric X-ray radiation

Brenzinger, K.-H.; Herberg, C.; Limburg, Bart; Backe, H.; Dambach, S.; Euteneuer, H.; Hagenbuck, F.; Hartmann, Hermann; Johann, Kerstin; Kaiser, K.-H.; Kettig, O.; Knies, G.; Kube, G.; Lauth, W.; Schöpe, Hans Joachim; Walcher, Th.

doi:10.1007/s002180050283

Cited by 72 publications

(59 citation statements)

References 32 publications

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“…For an overview of the theoretical and experimental work up to the year 1997 see, e.g., ref. [46] and also ref. [47,48,49,50] for the recent works.…”

Section: Parametric X-radiationmentioning

confidence: 67%

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Coherent X-rays at MAMI

et al. 2006

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Abstract. Coherent radiation in the range from soft X-rays up to hard X-rays, produced by the lowemittance electron beam of MAMI, can be used for various applications. Novel types of interferometers have been developed for the measurement of the complex index of refraction of thin self-supporting foils. For the vacuum ultraviolet and soft X-ray region the interferometer consists of two collinear undulators, and a grating spectrometer. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the L 2,3-absorption edges of nickel. A novel method is described for the measurement of the X-ray magnetic circular birefringence. For the hard X-ray region the interferometer consists of two foils at which the 855 MeV electron beam produces transition radiation. Distinct interference oscillations have been observed as a function of both, the photon emission angle and the distance between the foils. The refractive index decrement δ(ω) of a 2 µm thick nickel sample foil has been measured at X-ray energies around the K absorption edge at 8333 eV and at 9930 eV with an accuracy of better than 1.5 %. The line width of parametric X radiation (PXR) was measured in backward geometry with a Si single-crystal monochromator. Upper limits of the line width of 42 meV, 50 meV, and 44 meV, have been determined for the (333), (444) and (555) reflections at photon energies of 5932 eV, 7909 eV, and 9887 eV, respectively. Small angle scattering of the electrons in the crystal leads to a stochastic frequency modulation of the exponentially damped wave train which results in the line broadening. To elucidate the quest if the production of PXR is a kinematical or a dynamical process the radiation from silicon single-crystal targets, emitted close to the electron direction, has been studied. The observed interference structures and the narrow-band radiation in forward direction shows that PXR is produced in a dynamical process. .Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) -41.60.-m Radiation by moving charges -41.50.+h X-ray beams and X-ray optics PACS.

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“…For an overview of the theoretical and experimental work up to the year 1997 see, e.g., ref. [46] and also ref. [47,48,49,50] for the recent works.…”

Section: Parametric X-radiationmentioning

confidence: 67%

“…The theoretical description of the intensity distribution of PXR [51,52,45,53,54], suitably modified for self-absorption and multiple-scattering effects, has been tested for a broad range of electron energies extending from 3.5 MeV [55,56] to about 1 GeV [46]. It was found to be accurate within 12%.…”

Section: Parametric X-radiationmentioning

confidence: 99%

Coherent X-rays at MAMI

et al. 2006

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“…¬ÓÑÏÇ ÕÑÅÑ, ÄÞÓÂÉÇÐËÇ (17) ÃÎËÊÍÑ Í ÄÞÓÂÉÇ-ÐËâÏ, ÒÑÎÖÚÇÐÐÞÏ Ä ÓÂÏÍÂØ AEÓÖÅËØ ÄÇÓÔËÌ ÍËÐÇÏÂÕËÚÇ-ÔÍÑÌ ÕÇÑÓËË ±²ª, ÍÑÕÑÓÞÇ ÑÃÔÖÉAEÂáÕÔâ Ä [28].…”

Section: °õóâéçðëç óçðõåçðñäôíñåñ ëêîöúçðëâ ñõ ñAeðñì íóëôõâîîñåóâ×unclassified

Fresnel coefficients for parametric X-ray (Cherenkov) radiation

Shchagin¹

2015

Usp. Fiz. Nauk

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“…2, which now must be convoluted with the reflecting power ratio of the analyzer crystal |r P A | 2 , Eq. (16). Since the analyzer crystal has never the ideal structure as mathematically assumed, on this basis a method could be developed to diagnose the surface bending radii of large area single crystals.…”

Section: Discussionmentioning

confidence: 99%

“…for an overview up to the year 1997 Ref. [16] and references cited therein, as well as Ref. [17][18][19][20].…”

Section: Introductionmentioning

confidence: 99%

<title>Forward diffracted parametric X radiation from a thick Tungsten single crystal at 855 MeV electron energy</title>

et al. 2007

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Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 µm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101) plane at a Bragg angle of 3.977• . Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

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Investigation of the production mechanism of parametric X-ray radiation

Cited by 72 publications

References 32 publications

Coherent X-rays at MAMI

Coherent X-rays at MAMI

Fresnel coefficients for parametric X-ray (Cherenkov) radiation

<title>Forward diffracted parametric X radiation from a thick Tungsten single crystal at 855 MeV electron energy</title>

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