2018
DOI: 10.1007/s10854-018-0299-z
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Investigation of the properties of nanostructured nickel oxide NiO thin films irradiated at different γ-doses

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Cited by 32 publications
(3 citation statements)
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“…26 The additional peaks indicated by the "*" symbol correspond to FTO substrate. 27 To notice the influence of ion irradiation closely, several factors using XRD patterns were calculated. The average crystallite size, dislocation density and strain in pristine and Ag 9+ ion irradiated NiO thin films were estimated by considering the (111), (200), and (220) planes.…”
Section: Results and Discussion For Nio Thin Filmsmentioning
confidence: 99%
“…26 The additional peaks indicated by the "*" symbol correspond to FTO substrate. 27 To notice the influence of ion irradiation closely, several factors using XRD patterns were calculated. The average crystallite size, dislocation density and strain in pristine and Ag 9+ ion irradiated NiO thin films were estimated by considering the (111), (200), and (220) planes.…”
Section: Results and Discussion For Nio Thin Filmsmentioning
confidence: 99%
“…12b). The Raman spectrum of sample 3 contains bands with maxima at 530 cm -1 and 1060 cm -1 , which correspond to the spectrum of nickel oxide [56] -Fig. 8 e. It follows from the STEM and Raman data that after annealing sample 1 in air at 1173 K, it is converted into nano dispersed nickel oxide with a particle size near 5÷8 nm.…”
Section: 22mentioning
confidence: 85%
“…26,35 The obtained Raman results is strongly agreed with earlier documented data. [36][37][38] The Raman measurements of the NiO/ZnO@30 min and NiO/ZnO@60 min are shown in Fig. 3b.…”
mentioning
confidence: 99%