2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) 2013
DOI: 10.1109/elnano.2013.6552043
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Investigation of the relative sensitivity of control of impulse X-ray television systems

Abstract: method of calculating the relative sensitivity for Xray television systems based on X-ray screens, CCD cameras and impulse x-ray devices was proposed. To visualize the images formed by the pulsed X-ray radiation, an adjustable duration of accumulation on the CCD camera was used. The relative sensitivity of the control is determined by the intersection of dependences of the luminance and threshold contrast on the size of the defect. The comparison of calculated and experimental values of the relative sensitivit… Show more

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