Investigation of the scintillation light from liquid argon doped with xenon

Minerskjöld, Maxim; Lindblad, Thomas; Lund‐Jensen, B.; Székely, G.

doi:10.1016/0168-9002(93)91123-5

Cited by 3 publications

(3 citation statements)

References 7 publications

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“…The main disadvantage of any WLS film is low geometrical efficiency, since the light is re-emitted in 4π solid angle, sensitivity to mechanical stress, long term stability [12], scattering and re-absorption of the re-emitted light inside the WLS layer [11,13] and also dependence of the WLS efficiency on the coating method.An elegant idea is to use volume-distributed WLS, which can provide a higher efficiency of re-emission and better collection of the scintillation light. This improves position reconstruction since the re-emission occurs in the point of interaction.It was shown that gaseous xenon doped in LAr works as a volume-distributed WLS shifting the wave length from 128 nm to around 175 nm [14][15][16]. Currently several groups are studying its wavelength shifting parameters and the properties of the LAr+Xe mixture [17][18][19][20].…”

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Fast component re-emission in Xe-doped liquid argon

Akimov¹,

Belov²,

Konovalov³

et al. 2019

J. Inst.

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A: We present the first direct experimental confirmation of the fast component re-emission in liquid argon (LAr) doped with xenon (Xe). This effect was studied at various Xe concentrations up to ∼3000 ppm. The rate constant of energy transfer for the fast component was quantified. It was shown that LAr doped with a high concentration of Xe without TPB has a better PSD efficiency than pure LAr or Xe-doped LAr with TPB. The stability of LAr+Xe mixture was tested for the first time at high Xe concentration for long continuous runtimes. K: Ionization and excitation processes; Noble liquid detectors (scintillation, ionization, double-phase); Particle identification methods; Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators) 1Corresponding author.The most commonly used WLS for LAr is tetraphenyl butadiene (TPB). It is used for coating PMTs, detector walls and other elements of optical systems [10,11]. The main disadvantage of any WLS film is low geometrical efficiency, since the light is re-emitted in 4π solid angle, sensitivity to mechanical stress, long term stability [12], scattering and re-absorption of the re-emitted light inside the WLS layer [11,13] and also dependence of the WLS efficiency on the coating method.An elegant idea is to use volume-distributed WLS, which can provide a higher efficiency of re-emission and better collection of the scintillation light. This improves position reconstruction since the re-emission occurs in the point of interaction.It was shown that gaseous xenon doped in LAr works as a volume-distributed WLS shifting the wave length from 128 nm to around 175 nm [14][15][16]. Currently several groups are studying its wavelength shifting parameters and the properties of the LAr+Xe mixture [17][18][19][20]. As shown previously [21], Xe doped in small concentrations (up to 260 ppm by mass) re-emits only the slow component of LAr scintillation. Thus, at small concentrations it is impossible to use Xe as a single stage WLS and to keep PSD capability of the LAr+Xe mixture at the same time.In previous studies with a broad concentration range (up to 1000 ppm by mass) [19,20], it was shown that Xe-doping slightly improves the light yield and the energy resolution. Also they demonstrated that the PSD capability degrades with decreasing of Xe concentration in LAr. Both experiments [19,20] have shown that at the concentrations of Xe > 300 ppm the PSD capability of the LAr+Xe mixture is higher than that of pure LAr.One experimental study [20] indicated evidence of fast component re-emission at high Xe concentrations. However, the measurement scheme was very complicated, statistics were quite low, and the effect of the re-emission by Xe was obscured by the use of TPB. In our study, we confirm the clear observation of the fast component re-emission in LAr doped at high Xe concentration (∼1100 ppm by mass). We show the dependence of this effect on the increase of Xe concentration and its relation to PSD efficiency. We also present the first experimental measur...

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confidence: 99%

“…It was shown that gaseous xenon doped in LAr works as a volume-distributed WLS shifting the wave length from 128 nm to around 175 nm [14][15][16]. Currently several groups are studying its wavelength shifting parameters and the properties of the LAr+Xe mixture [17][18][19][20].…”

mentioning

confidence: 99%

Fast component re-emission in Xe-doped liquid argon

Akimov¹,

Belov²,

Konovalov³

et al. 2019

J. Inst.

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“…The peak wavelength of the emission spectrum shifts from 128 nm of argon scintillation to 176 nm of xenon scintillation which can be detected by commercial photodetectors. Therefore, xenon-doped in liquid argon could work as a volume-distributed WLS [19,20] which is expected to provide better positional reconstruction capability since the re-emission occurs in the point of interaction.…”

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confidence: 99%

Using ²²Na and ^83mKr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Gan¹,

Guan²,

Zhang³

et al. 2020

J. Inst.

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We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a 22Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of 83mKr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the 22Na and 83mKr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.

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Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Gan,

Guan,

Zhang

et al. 2020

Preprint

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We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a 22 Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of 83m Kr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the 22 Na and 83m Kr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.

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Investigation of the scintillation light from liquid argon doped with xenon

Cited by 3 publications

References 7 publications

Fast component re-emission in Xe-doped liquid argon

Fast component re-emission in Xe-doped liquid argon

Using ²²Na and ^83mKr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

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Investigation of the scintillation light from liquid argon doped with xenon

Cited by 3 publications

References 7 publications

Fast component re-emission in Xe-doped liquid argon

Fast component re-emission in Xe-doped liquid argon

Using 22Na and 83mKr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

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Using ²²Na and ^83mKr to calibrate and study the properties of scintillation in xenon-doped liquid argon