Investigation of the XPS Valence Band Structure from Sn Chalcogenides

Abstract

XPS valence band spectra reflect the electronic density of states weighted with cross-sections. The spectra will give additional information about the symmetry of the electron wave function, if they are measured in dependence on the electron emission angles. VaIence band spectra of SnS, SnSe, SnTe, and SnS, are measured partly in dependence on the polar angle 8. These measurements allow an identification of the symmetry of valence orbitals from intensity variations of the valence band maxima.XPS-Valenzbandspektren bilden die mit Wirkungsquerschnitten gewichtete elektronische Zustandsdichte ah. Werden die Spektren in Abhangigkeit von den Elektronenemissionswinkeln aufgenommen, so liefern sie zusatzliche Informationen iiber die Symmetrie der Elektronenwellenfunktion. Von SnS, SnSe, SnTe und SnS, werdenteils in Abhangigkeit vom Polarwinkel 8die Valenzbandspektren gemessen. Diese Messungen ermoglichen es, die Symmetrie der Valenzorbitale aus Intensit~ts~inderungen der Valenzhandmaxima zu hestimmen.

Monte Carlo simulation of texture formation

“…The winding number is simply the signed area of ' T, given by [14,16] and ~h e r e p ,~--~#~~. 4 , ( i , j = 1 , 2 , 3 ) .…”

Revisiting the Key Optical and Electrical Characteristics in Reporting the Photocatalysis of Semiconductors

“…For determining the composition of the photocatalysts, XPS is well known as a powerful tool, but another application of XPS that should be considered is to determine the band offset of heterojunctions. − Compared to the mentioned approach of Mott–Schottky, evaluating band shifting with XPS is more accurate because XPS records the elements’ core levels, which are more stable than the surface value. In other words, the VB offset could be accurately determined when the deviation of the core levels before and after contact is measured.…”

Revisiting the Key Optical and Electrical Characteristics in Reporting Photocatalysis of Semiconductors

“…For determining the composition of the photocatalysts, X-ray photoelectron spectroscopy (XPS) is well known as a powerful tool, but another application of XPS that should be considered is to determine the band offset of heterojunctions [33][34][35][36][37][38] . Comparing to the mentioned approach of Mott-Schottky, evaluating band shifting with XPS is more accurate because XPS records the elements' core levels, which are more stable than the surface value.…”