2019
DOI: 10.1049/iet-pel.2018.5912
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Investigation on conducted EMI noise source impedance extraction for electro magnetic compatibility based on SP‐GA algorithm

Abstract: A new approach employing scattering parameters (SPs) and genetic algorithm (GA) (SP-GA) is proposed for modelling conducted electromagnetic interference (EMI) noise source impedance. Based on the principle of SPs, the source impedance is measured through transmission and reflection parameters from a vector network analyser when the circuit is shorted and loaded with noise source impedance, respectively. Moreover, amplitude-frequency performance and phasefrequency performance are optimised by using GA, and ther… Show more

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Cited by 7 publications
(3 citation statements)
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“…For the result of the equivalent parameter, it can also be judged by determination (Cd), and its expression can be expressed as [26] Cd=SSRSST=false∑i=1n)(yi^yi¯2false∑i=1n)(yiyi¯2 …”
Section: Experimental Results and Analysismentioning
confidence: 99%
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“…For the result of the equivalent parameter, it can also be judged by determination (Cd), and its expression can be expressed as [26] Cd=SSRSST=false∑i=1n)(yi^yi¯2false∑i=1n)(yiyi¯2 …”
Section: Experimental Results and Analysismentioning
confidence: 99%
“…The amplitude and phase of the impedance Z X of the EUT can be extracted by the SP method. Then, to improve the accuracy of the SP method and determine the RLC parameters of impedance, the previous work [26] has employed the SP method in cooperation with GA and proposed a novel approach. The optimal parameter solutions obtained by GA are marked as R best , L best and C best .…”
Section: Noise Source Impedance Modelling Based On the Gamentioning
confidence: 99%
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