2013
DOI: 10.4028/www.scientific.net/amr.832.471
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Investigation on the Structural Changes of Cupric Oxide (CuO) Nanostructures by Thermal Oxidation Process

Abstract: A simple and cost effective method using a thermal oxidation process for synthesizing cupric oxide (CuO) nanostructures is demonstrated in this paper. Using elevated temperatures ranging from 100°C to 400°C, the optimum formation of CuO composition indicated by an X-ray diffraction (XRD) was obtained at 400°C. Then, the effects of gas flow rates (ranging from 1 to 10 kPa) on the formation of CuO nanorods were investigated using a field emission scanning electron microscope (FESEM). It was found that at higher … Show more

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Cited by 3 publications
(3 citation statements)
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“…The average crystalline grain size D of CuO NSs was estimated analyzing the diffraction peaks from XRD data using Debye–Scherer’s formula: , D = K λ/β cos θ, where λ is the X-ray wavelength (1.54060 Å), K is the Scherrer constant (0.9), β is the full width at half-maximum of the diffraction peak (in rad), and θ is the Bragg diffraction angle. Average grain size values were calculated to be 21.6 and 17.5 nm for the CuO(002) and (111) crystal planes, respectively.…”
Section: Results and Discussionmentioning
confidence: 99%
“…The average crystalline grain size D of CuO NSs was estimated analyzing the diffraction peaks from XRD data using Debye–Scherer’s formula: , D = K λ/β cos θ, where λ is the X-ray wavelength (1.54060 Å), K is the Scherrer constant (0.9), β is the full width at half-maximum of the diffraction peak (in rad), and θ is the Bragg diffraction angle. Average grain size values were calculated to be 21.6 and 17.5 nm for the CuO(002) and (111) crystal planes, respectively.…”
Section: Results and Discussionmentioning
confidence: 99%
“…During thermal oxidation of bulk Cu, Cu 2 O is first formed first followed by CuO formation after a sufficiently long oxidation time [22,34]. Growth mechanism for the CuO film formation can be summarized as follows [35]:…”
Section: Growth Of Cuo Nanostructures and Thin Filmmentioning
confidence: 99%
“…The mean crystalline grain size D of the CuO TF and NLs can be obtained from the XRD profiles using the Debye-Scherrer's formula [9,35]…”
Section: Morphological Analysismentioning
confidence: 99%