1980 International Electron Devices Meeting 1980
DOI: 10.1109/iedm.1980.189918
|View full text |Cite
|
Sign up to set email alerts
|

Investigations of gate turn-off structures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1982
1982
1988
1988

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 6 publications
0
1
0
Order By: Relevance
“…In order to avoid excessive current densities, such devices should be highly interlaced with very narrow emitter fingers. Minority carrier lifetimes should also be reduced to speed up turn-off and thus reduce transient thermal dissipation (Becke and Misra 1980).…”
Section: Gate Turn-off Thyristor (Gto)mentioning
confidence: 99%
“…In order to avoid excessive current densities, such devices should be highly interlaced with very narrow emitter fingers. Minority carrier lifetimes should also be reduced to speed up turn-off and thus reduce transient thermal dissipation (Becke and Misra 1980).…”
Section: Gate Turn-off Thyristor (Gto)mentioning
confidence: 99%