2015
DOI: 10.1016/j.apsusc.2015.10.140
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Investigations of the composition of macro-, micro- and nanoporous silicon surface by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy

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Cited by 20 publications
(8 citation statements)
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“…It is worth mention that the Si 2p spectra of NH 2 -MSNs showed a single peak at 102.3 eV, which was marginally higher than that of NH 2 -ASNs at 101.9 eV. Considering the fact that the characteristic Si 2p BE peaks of elementary Si and SiO 2 reported in the literature are at 99.5 and 103.5 eV 79 , respectively, our results imply that silicon in the surface layer of NH 2 -ASNs and NH 2 -MSNs may exist as intermediate sub-oxide phases (SiO x , 0 < x ≤ 1) rather than the fully oxidized SiO 2 79,80 due to a greater presence of elementary non-oxidized Si in the surface layers of NH 2 -ASNs and NH 2 -MSNs. Furthermore, these values were consistent with those reported for functionalized silica nanoparticles 39,81 , and mesoporous silica 6,46 systems.…”
Section: Cr(vi) Adsorption and Removal Efficiency Of Asns Msns Nh 2supporting
confidence: 52%
“…It is worth mention that the Si 2p spectra of NH 2 -MSNs showed a single peak at 102.3 eV, which was marginally higher than that of NH 2 -ASNs at 101.9 eV. Considering the fact that the characteristic Si 2p BE peaks of elementary Si and SiO 2 reported in the literature are at 99.5 and 103.5 eV 79 , respectively, our results imply that silicon in the surface layer of NH 2 -ASNs and NH 2 -MSNs may exist as intermediate sub-oxide phases (SiO x , 0 < x ≤ 1) rather than the fully oxidized SiO 2 79,80 due to a greater presence of elementary non-oxidized Si in the surface layers of NH 2 -ASNs and NH 2 -MSNs. Furthermore, these values were consistent with those reported for functionalized silica nanoparticles 39,81 , and mesoporous silica 6,46 systems.…”
Section: Cr(vi) Adsorption and Removal Efficiency Of Asns Msns Nh 2supporting
confidence: 52%
“…As substrates for the growth of AlxGa1-xN/ AlN layers, we used both traditional substrates of monocrystalline KDB (111) silicon and the same substrates with a nanoporous layer previously formed according to an original technique described in [9], with a thickness of about 20 nm and an average pore diameter less than 5 nm.…”
Section: Methodsmentioning
confidence: 99%
“…To solve these problems, various attempts have been recently made, in order to deploy different transition buffer layers of A3N/Si into the heterostructure [6][7][8][9]. Buffer layers can involve multiperiodic super-lattices, the layers with alternating 2D and 3D morphology, layers with a gradual variation of the composition as well as their combinations.…”
Section: Introductionmentioning
confidence: 99%
“…О б з о р н ы е с п е к т р ы XPS. Обзорные XPS-спектры и спектры остовных уровней образцов исходного por-Si и НК Sn/por-Si были измерены на ла-бораторном спектрометре фирмы SPECS ФТИ УрО РАН по методике, описанной выше и аналогичной использо-ванной в работе [16]. Съемка образцов проводилась без травления и с травлением аргонной пушкой в течение 1 и 3 min.…”
Section: результаты и обсуждениеunclassified
“…Анализ Si 2p-спектров показывает, что полученные данные по составу " мезопористого" кремния хорошо согласуются с известными литературными данными. Ранее нами было установлено [16,17], что поверх-ностные слои пористого кремния состоят из диоксида кремния (Si 2p, E b = 103.5 eV), субоксидов кремния (Si 2p, E b = 100.5−103 eV) и неокисленного кремния в кристаллическом или аморфном состоянии (Si 2p, E b = 99.5 eV). При этом известно и многократно под-тверждено, что со временем хранения доля оксидных фаз в пористом слое растет, особенно в поверхност-ных слоях.…”
Section: результаты и обсуждениеunclassified