2010
DOI: 10.1149/1.3481628
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(Invited) First-Principles Investigation of High-k Dielectrics for Nonvolatile Memories

Abstract: Using first-principles simulations, we investigate the electronic and dielectric properties of a set of oxides eligible for non-volatile memory applications. We show that aluminum oxide and rare earth based aluminates have promising properties in terms of band gap, dielectric constant and are potential candidates for the replacement of SiO 2 for flash applications.

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Cited by 3 publications
(1 citation statement)
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“…Additionally, κ ∞ is related to the refractive index of the material (i.e., κ ∞ = n 2 ), [ 62 ] and κ ion is associated with the phonon density of states (i.e., oxygen vacancies). [ 63 ] Hence, the equivalent dielectric constants of the Gd x O y and Al x O y dielectric layers changed with the distribution of oxygen vacancies in the dielectric films. Cockayne proposed that κ ion with different numbers of oxygen vacancies per 64 oxygen atoms can be used for FP electronic calculations, [ 64 ] as presented in the simulation results of Figure 3e,f, which were consistent with the PARs of the non‐lattice oxygen obtained in the XPS analyses.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, κ ∞ is related to the refractive index of the material (i.e., κ ∞ = n 2 ), [ 62 ] and κ ion is associated with the phonon density of states (i.e., oxygen vacancies). [ 63 ] Hence, the equivalent dielectric constants of the Gd x O y and Al x O y dielectric layers changed with the distribution of oxygen vacancies in the dielectric films. Cockayne proposed that κ ion with different numbers of oxygen vacancies per 64 oxygen atoms can be used for FP electronic calculations, [ 64 ] as presented in the simulation results of Figure 3e,f, which were consistent with the PARs of the non‐lattice oxygen obtained in the XPS analyses.…”
Section: Resultsmentioning
confidence: 99%