Abstract:The rapid improvement of semiconductor technologies is the enabling factor for the design of large-scale Systemon-Chip (SoC) architectures. At the same time the scale-down of feature sizes in silicon technologies brings up new challenges as parameter variations of the transistor devices, an increased vulnerability for wear-out effects during the lifetime of the device and increased sensitivity for soft-errors. The overall system reliability is therefore an important topic to be addressed in the SoC design proc… Show more
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