Crystalline Semiconducting Materials and Devices 1986
DOI: 10.1007/978-1-4757-9900-2_15
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Ion Implantation and Annealing

E. Rimini
1
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Non-Destructive Determination of Ion-Implanted Impurity Distribution in Silicon by EPMA

Alexeyev
1
1992
Mikrochimica Acta
2
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Non-Destructive Determination of Ion-Implanted Impurity Distribution in Silicon by EPMA

Alexeyev
1
1992
Mikrochimica Acta
2
0
0
0
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Co Dimers Observed by Extended X-Ray Absorption Fine Structure Spectroscopy

Faraci
1
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Pennisi
2
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Balerna
3
et al. 2001
Phys. Rev. Lett.
12
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