Ion-Induced Surface Modification of Magnetically Operated Contacts

Arushanov, K.A.; Zeltser, I. A.; Karabanov, Sergey M.; Maizels, R M; Моос, Е. Н.; Tolstogouzov, A.

doi:10.3390/coatings2010008

Cited by 5 publications

(4 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The duration of the single ion-plasma treatment was 30 s with 30 s pause between each single treatment, and the total number of such treatments was as high as 30. In that case, the reed switch is considered as a simple diode system, where blades act as electrodes (cathode and anode), and the glass bulb filled with nitrogen serves as a working chamber (for detail, see [6][7][8][9] and references cited therein).…”

Section: Resultsmentioning

confidence: 99%

“…The main difference of the prototype against a standard device is the absence of the goldruthenium electrodeposited coatings on the contact surfaces. Instead of those, nitrogen-containing iron/nickel coatings were fabricated directly in reed switches using pulsed ion-plasma treatment [6][7][8][9]. The contacts (blades) were pressed with vacuum-melt permalloy (Ni 52 wt %, Fe 48 wt %) wires by Dilaton™, degreased, and annealed in hydrogen atmosphere.…”

Section: Methodsmentioning

confidence: 99%

“…The surface erosion of magnetically operated hermetical contacts (reed switches or RS) [1] occurring under the commutation of electrical current is similar in many respects to the processes taking place in the course of explosive electron emission, arc and spark discharges [2,3], electrical discharge machining and doping [4,5], surface modification by pulse discharges [6][7][8][9], and high-intensity ion, plasma, and laser irradiation of materials [10,11]. There are currently no generally recognized models explaining these processes, since they occur under non-equilibrium conditions, in limited volumes, and during short time intervals.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Surface Erosion of Low-Current Reed Switches

Zeltser

Karpov²,

Моос

et al. 2017

Coatings

Self Cite

View full text Add to dashboard Cite

Abstract:The erosion model of the surface coatings of reed switches considering different physicochemical processes occurring on the contact surfaces and inside the inter-electrode gap was proposed. According to that, the discrete electron avalanche (ecton) introduced in the explosive electron emission theory by Mesyats is considered as the main motive force responsible for the surface modification and mass transfer of materials in the course of breaking/shorting of the contacts. By means of SEM imaging and energy dispersive X-ray microanalysis of the contact surfaces after various numbers of switching cycles, the energy threshold of the ecton generation defining the erosion stability of the coatings was found to be proportional to the specific sublimation and ionization energies of coating materials. It has been shown that the total erosion of the coatings on the working surface of the contacts after the commutation test possess the resultant character; i.e., the specificities of erosion occurring after each commutation event are characteristic for the whole of the commutation test. In further development of our model, we suggested that a few monolayers of metals (or alloys) with low ionization potential deposited on the main coatings can improve the erosion stability of contacts.

show abstract

Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Surface Erosion of Low-Current Reed Switches

Zeltser

Karpov²,

Моос

et al. 2017

Coatings

Self Cite

View full text Add to dashboard Cite

show abstract

“…In our previous works [2][3][4], we showed that contamination and defects of the contacting surfaces of reed switches affected their conductivity and breakdown voltage. Reed switches belong to the class of electromechanical devices of millimeter dimension.…”

Section: Introductionmentioning

confidence: 89%

Characterization on Contacting Surfaces of MEMS Electrostatic Switches by SEM, EDXA, and XPS

Afinogenov¹,

Zeltser²,

Trunin³

et al. 2015

Advances in Materials Science and Engineering

View full text Add to dashboard Cite

We focus on the origin and sources of surface contamination and defects causing the failure of MEMS electrostatic switches. The morphology, and elemental and chemical compositions of the contacting surfaces, conducting paths, and other parts of switches have been characterized by means of SEM, EDXA, and XPS in order to understand the difference between the data collected for the devices that had passed the electrical conductivity test and those found to be defective. C, O, Al, Ca, Ti, Cu, and some other impurities were detected on the details of defective switches. Contrariwise, the working switches were found to be clean, at least on the level of EDXA and XPS sensitivity. The main sources of surface contamination and defects were incompletely deleted sacrificial layers, substrate materials, and electrolytes employed for Rh plating of the contacts. The negative influence of foreign microparticles, especially alumina and copper oxides, on the conductivity and porosity of contacts was highlighted.

show abstract