Ionization interference in the acetylene-nitrous oxide flame

Kornblum, G.R.; Galan, L. de

doi:10.1016/0584-8547(73)80017-5

“…); -transport problems and differences in physical properties between the standards and the samples, such as viscosity, surface tension, etc. [9,11,23]; and -some errors in sample preparation [16,23] By correcting for these types of problem the precision and accuracy of the measurement can be improved [11,12,13]. While the reference-element technique can correct for many typical problems observed in FAAS determinations, one limitation of the technique is that it may not correct for non-spectral interferences which can occur.…”

Section: The Reference-element Technique In Faasmentioning

confidence: 99%

“…The advantages of FAAS, which can be applied to 68 elements in a variety of matrices (even with high dissolved solids) are well known and accepted. They include well-known and controllable interferences [4,5,6,7,8,9], relatively low operator skill required for routine operation, and comparatively low cost instrumentation and operation. With these many advantages, FAAS is an ideal tool for routine determination of elements in the mg L -1 concentration range and, as a result, has been widely accepted as a basic technique used in almost every laboratory dealing with inorganic elemental analyses.…”

Section: Introductionmentioning

confidence: 99%

Application of the reference-element technique for fast sequential flame atomic-absorption spectrometry

Projahn¹,

Steeg

²

,

Sanders

³

et al. 2004

Analytical and Bioanalytical Chemistry

22

0

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Fast sequential flame atomic-absorption spectrometry (FS-FAAS) is able to measure a sequence of analyte wavelengths in one monochromator scan and so achieves or exceeds the analysis speed of sequential ICP-OES. The requirements and implementation of an FS-FAAS instrument are presented in detail. FS-FAAS is a sequential multi element technique which retains the advantages of conventional FAAS, for example ease of use. While the FS-FAAS technique is an ideal tool for routine determination of elements in the mg L(-1) concentration range, it is still subject to common sources of error such as transport problems and long-term drift. The reference-element technique can be used to correct for these types of common interference; other advantages include correction of some errors which are induced during sample preparation, and improved analytical accuracy and precision. The reference-element technique when utilizing the FS- FAAS technique is described in detail and benefits of the technique will be demonstrated by comparing performance for selected applications, for example a mineral sample and a scrap wood digest.

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“…With this type of Interference, the analyte emission intensity drops smoothly toward zero with increasing concentrations of the interferent. The types of solute vaporization interferences discussed above may occur in combination for a given pair of analyte and interferent.An ionization interference results from a shift in the ionization equilibrium of the analyte (M):Because the electron number density is relatively low in combustion flames with only a small quantity of metallic species Introduced, the presence of easily ionizable elements in the sample may produce significant increases in the elec tron number density (11,(18)(19)(20). The resulting shift in the ionization equilibrium will produce an increase in the neutral atom number density and an accompanying (but not necessarily equal) decrease in the ion number density.…”

mentioning

confidence: 99%

“…Because the electron number density is relatively low in combustion flames with only a small quantity of metallic species Introduced, the presence of easily ionizable elements in the sample may produce significant increases in the elec tron number density (11,(18)(19)(20). The resulting shift in the ionization equilibrium will produce an increase in the neutral atom number density and an accompanying (but not necessarily equal) decrease in the ion number density.…”

mentioning

confidence: 99%

Investigations of several interference effects in high frequency plasmas of analytical importance

Larson¹

1977

0

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INFORMATION TO USERSThis material was produced from a microfilm copy of the original document. While the most advanced technological means to photograph and reproduce this document have been used, the quality is heavily dependent upon the quality of the original submitted.The following explanation of techniques is provided to help you understand markings or patterns which may appear on this reproduction. 1.The sign or "target" for pages apparently lacking rrom the document photographed is "Missing Pagels)". If it was possible to obtain the missing page(s) or section, they are spliced into the film along with adjacent pages. This may have necessitated cutting thru an image and duplicating adjacent pages to insure you complete continuity. When an image on the film is obliterated with a large round black mark, itis an indication that the photographer suspected that the copy may have moved during exposure and thus cause a blurred image. You will find a good image of the page in the adjacent frame.3. When a map, drawing or chart, etc., was part of the material being photographed the photographer foiiovved a definite mpthnn in "sectioning" the material. It is customary to begin photoing at the upper left hand corner of a large sheet and to continue photoing from left to right in equal sections with a small overlap. IV necessary, sectioning is continued again -beginning below the first row and continuing on until complete. The majority of users indicate that the textual content is of greatest value,however, a somewhat higher quality reproduction couid be made uom "photographs" if essential to the undei-standing of the dissertation. Silver prints of "photographs" may be ordered at additional charge by writing the Order Department, giving the catalog number, title, author and specific pages you wish reproduced. Solute vaporization interferences occur when the rate of vaporization of the desolvated aerosol particle is altered by the presence of a concomitant (11,12). A reduced efficiency of free atom formation can result from the formation of a less volatile compound. With this type of interference, a plot of the analyte emission intensity versus the concentration of the concomitant exhibits a linear decrease in intensity followed by a "knee" and a plateau region (11)(12)(13)(14). The "knee" in the curve usually occurs at concentration ratios of the concomitant to the 3 analyte equivalent to the formation of a definite refractory compound. The plateau region indicates that the excess Interferent is readily vaporized from the aerosol droplet. PLEASE NOTEA solute vaporization interference may also result from the occlusion of the analyte in a refractory matrix of the con comitant which is not completely vaporized In the vaporization-atomlzatlon source (11)(12)(13)(15)(16)(17). With this type of Interference, the analyte emission intensity drops smoothly toward zero with increasing concentrations of the interferent. The types of solute vaporization interferences discussed above may occur in combination for a given pair of a...

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“…Because the electron number density is relatively low in combustion flames with only a small quantity of metallic species Introduced, the presence of easily ionizable elements in the sample may produce significant increases in the elec tron number density (11,(18)(19)(20). The resulting shift in the ionization equilibrium will produce an increase in the neutral atom number density and an accompanying (but not necessarily equal) decrease in the ion number density.…”

Section: Chapter I Introductionmentioning

confidence: 99%

Investigations of several interference effects in high frequency plasmas of analytical importance

Larson

¹

0

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INFORMATION TO USERSThis material was produced from a microfilm copy of the original document. While the most advanced technological means to photograph and reproduce this document have been used, the quality is heavily dependent upon the quality of the original submitted.The following explanation of techniques is provided to help you understand markings or patterns which may appear on this reproduction. 1.The sign or "target" for pages apparently lacking rrom the document photographed is "Missing Pagels)". If it was possible to obtain the missing page(s) or section, they are spliced into the film along with adjacent pages. This may have necessitated cutting thru an image and duplicating adjacent pages to insure you complete continuity.2. When an image on the film is obliterated with a large round black mark, it is an indication that the photographer suspected that the copy may have moved during exposure and thus cause a blurred image. You will find a good image of the page in the adjacent frame. When a map, drawing or chart, etc., was part of the material being photographed the photographer foiiovved a definite mpthnn in "sectioning" the material. It is customary to begin photoing at the upper left hand corner of a large sheet and to continue photoing from left to right in equal sections with a small overlap. IV necessary, sectioning is continued again -beginning below the first row and continuing on until complete. 4. The majority of users indicate that the textual content is of greatest value, however, a somewhat higher quality reproduction couid be made uom "photographs" if essential to the undei-standing of the dissertation. Silver prints of "photographs" may be ordered at additional charge by writing the Order Department, giving the catalog number, title, author and specific pages you wish reproduced.

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Ionization interference in the acetylene-nitrous oxide flame

Cited by 34 publications

References 10 publications

Application of the reference-element technique for fast sequential flame atomic-absorption spectrometry

Application of the reference-element technique for fast sequential flame atomic-absorption spectrometry

Investigations of several interference effects in high frequency plasmas of analytical importance

Investigations of several interference effects in high frequency plasmas of analytical importance

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