Ionizing radiation hardening of a CCD technology

Simone, Alessio Di; Debusschere, I.; Alaerts, A.; Claeys, Cor

doi:10.1109/23.211392

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2016

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Cited by 10 publications

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“…Simone et al have presented the dark current density and threshold shift of hardening CCDs versus the accumulated dose and annealing time [4]. Hopkinson has investigated the methods which can restrain the increase of dark current in the CCDs induced by total ionizing dose (TID) [5].…”

Section: Introductionmentioning

confidence: 99%

Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage

Wang

et al. 2016

Journal of Sensors

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The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a60Coγ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.

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Section: Introductionmentioning

confidence: 99%