2023
DOI: 10.1109/tcad.2023.3276525
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iPROBE: Internal Shielding Approach for Protecting Against Front-Side and Back-Side Probing Attacks

Minyan Gao,
M. Sazadur Rahman,
Nitin Varshney
et al.
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Cited by 13 publications
(2 citation statements)
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“…Typically, these assets reside in secure tamper-proof memory (TPM) (e.g., non-volatile memory (NVM)) within the SiP and are passed through (unencrypted) the chiplets during data communication at the interposer layer. In this case, adversaries (in-field) can insert semi/non-invasive micro/nano probe needles into the interposer layer [51], [52], thus gaining access to the transmitted data [4], [43]. Consequently, they gain unauthorized access to extract the security assets, as shown in Figure 4.…”
Section: A Case C1: Probing-based Information Leakagementioning
confidence: 99%
“…Typically, these assets reside in secure tamper-proof memory (TPM) (e.g., non-volatile memory (NVM)) within the SiP and are passed through (unencrypted) the chiplets during data communication at the interposer layer. In this case, adversaries (in-field) can insert semi/non-invasive micro/nano probe needles into the interposer layer [51], [52], thus gaining access to the transmitted data [4], [43]. Consequently, they gain unauthorized access to extract the security assets, as shown in Figure 4.…”
Section: A Case C1: Probing-based Information Leakagementioning
confidence: 99%
“…For example, hardware reverse engineering solutions may be able to extract complete physical layouts from silicon dies. In the realm of invasive attack techniques, focused ion beam (FIB)-based micro-probing attacks [7,8] are gaining increasing attention within both academic and industrial circles. These attacks are noteworthy for their unique capability to intrude upon and manipulate the inner workings of a manufactured electronic circuit with minimal disruption to the overall system.…”
Section: Introductionmentioning
confidence: 99%