2004
DOI: 10.1021/la0492916
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IR Reflection Spectra of Monolayer Films Sandwiched between Two High Refractive Index Materials

Abstract: Monolayer films adsorbed on substrates with high refractive indices such as metals or semiconductors yield strongly enhanced infrared reflection spectra when they are contacted with a transparent, high refractive index ambient medium and are probed with p-polarized light at high incidence angles. The sensitivity increase arises from the enhancement of the perpendicular electric field within a thin, low refractive index layer sandwiched between two high refractive index materials and gives rise to signal intens… Show more

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Cited by 40 publications
(41 citation statements)
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“…It is interesting that although conventional ATR and specular reflection have similar intensity multipliers, the former method is approximately seven times more sensitive. Also it can be shown with the present formalism that regular reflectance can be viable but only for metal substrates near grazing incidence (h 1 $ 80°) when the sensitivity (per reflection) is similar to that for conventional ATR [5]. Fig.…”
mentioning
confidence: 76%
See 1 more Smart Citation
“…It is interesting that although conventional ATR and specular reflection have similar intensity multipliers, the former method is approximately seven times more sensitive. Also it can be shown with the present formalism that regular reflectance can be viable but only for metal substrates near grazing incidence (h 1 $ 80°) when the sensitivity (per reflection) is similar to that for conventional ATR [5]. Fig.…”
mentioning
confidence: 76%
“…The FTIR spectrometer, equipped with a silicon-carbide source, KBr beamsplitter, and HgCdTe detector, was operated in purge mode at a resolution of 8 cm À1 . The ATR method utilizes a high-index hemisphere in intimate contact with layers on a Si substrate [2][3][4][5] as depicted in the upper left inset of Fig. 1.…”
mentioning
confidence: 99%
“…106,107,111,115,118 Also odd-order spectroscopy can determine the average orientation of adsorbates via different signal strengths obtained from s-and p-polarized light. [122][123][124][125] In contrast to even-order spectrosocpy, however, they cannot distinguish parallel from anti-parrallel alignment.…”
Section: Selection Rules For Molecules At Interfacesmentioning
confidence: 96%
“…The sensitivity of the ATR-FTIR technique strongly depends on the thickness of the air gap between the sample and the hemisphere prism, 27,28 which makes it quite challenging to make a quantitative analysis of the peak intensity. However, the results shown in Fig.…”
Section: B Spectroscopic Analysis Of Thiol Sams On "001… Gaasmentioning
confidence: 99%