1986
DOI: 10.1016/0168-583x(86)90299-5
|View full text |Cite
|
Sign up to set email alerts
|

Iterative subtraction of backscattering spectra in determining the depth profile of arsenic implanted in niobium films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1986
1986
2006
2006

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…Other programs utilizing similar direct approaches have also been reported 32,33 . Zhang et al 34 studied the deconvolution of RBS spectra for binary mixtures using Fourier transform techniques.…”
Section: Class B)mentioning
confidence: 98%
“…Other programs utilizing similar direct approaches have also been reported 32,33 . Zhang et al 34 studied the deconvolution of RBS spectra for binary mixtures using Fourier transform techniques.…”
Section: Class B)mentioning
confidence: 98%