2009
DOI: 10.1007/s10853-009-3252-y
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ITO substrate resistivity effect on the properties of CuInSe2 deposited using two-electrode system

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Cited by 18 publications
(8 citation statements)
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“…These last peaks correspond to the most intense peaks given in the JCPDS card (File N • : 40-1487) for CuInSe 2 , they are corresponding respectively to the (101), (112), (103), (204)/(220), (116)/(312) and (424) planes [21]. On the other hand, the calculation of the preferential orientation degree in the films [6,22] shows the high degree of preferred orientation towards the <112> direction and the film annealed during 45 min presents the higher intensity ratio. This confirmed that all annealed films present a chalcopyrite phase of CuInSe 2 with a tetragonal structure and with <112> as preferred orientation.…”
Section: Resultsmentioning
confidence: 99%
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“…These last peaks correspond to the most intense peaks given in the JCPDS card (File N • : 40-1487) for CuInSe 2 , they are corresponding respectively to the (101), (112), (103), (204)/(220), (116)/(312) and (424) planes [21]. On the other hand, the calculation of the preferential orientation degree in the films [6,22] shows the high degree of preferred orientation towards the <112> direction and the film annealed during 45 min presents the higher intensity ratio. This confirmed that all annealed films present a chalcopyrite phase of CuInSe 2 with a tetragonal structure and with <112> as preferred orientation.…”
Section: Resultsmentioning
confidence: 99%
“…The instrumentation and the deposition method were the same as described in a previous work [6]. The ITO coated glass substrate is used as the working electrode (cathode).…”
Section: Methodsmentioning
confidence: 99%
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“…For this reason, in this work, simplified 2-electrode system is used instead of conventional 3-electrode system. There are various reports on the electrodeposition of thin film semiconductors using 2-electrode system which shows the reliability and applicability of this technique for fabrication of high quality thin film solar cells [17][18][19][20][21].…”
Section: Introductionmentioning
confidence: 99%
“…It is found that the intensity ratio, R I , is ranged between 0.6 and 0.7; this shows the high degree of preferred orientation towards (112) direction for all deposited films. The obtained values are in the same range than that for CuInSe 2 reported elsewhere [16]. The lattice constants (a and c), the dislocation density δ and the strain є in the films were calculated using the same scheme as described in ref.…”
Section: Resultsmentioning
confidence: 73%