2019
DOI: 10.3390/rs11010076
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Joint Learning of the Center Points and Deep Metrics for Land-Use Classification in Remote Sensing

Abstract: Deep learning methods, especially convolutional neural networks (CNNs), have shown remarkable ability for remote sensing scene classification. However, the traditional training process of standard CNNs only takes the point-wise penalization of the training samples into consideration, which usually makes the learned CNNs sub-optimal especially for remote sensing scenes with large intra-class variance and low inter-class variance. To address this problem, deep metric learning, which incorporates the metric learn… Show more

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Cited by 22 publications
(14 citation statements)
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“…Generally speaking, the cross-entropy loss is frequently applied to the scene classification of HRRSI, since it can evaluate the difference between the probability distribution of true labels and that of predicted labels [51,52], which may increase the discriminative ability of the CNN. Equation 4shows the cross-entropy loss function.…”
Section: The Center-based Cross Entropy Loss Functionmentioning
confidence: 99%
“…Generally speaking, the cross-entropy loss is frequently applied to the scene classification of HRRSI, since it can evaluate the difference between the probability distribution of true labels and that of predicted labels [51,52], which may increase the discriminative ability of the CNN. Equation 4shows the cross-entropy loss function.…”
Section: The Center-based Cross Entropy Loss Functionmentioning
confidence: 99%
“…Recently, some methods are presented to improve deep CNN features for remote sensing image classification. Gong (Gong et al, 2019) proposed a novel land-use classification method based on center-based structured metric learning (C-SML), which make full use of point-wise, pair-wise and class-wise information of training samples to improve the discrimination of the learned features. Thus, we also compare the proposed method with C-SML, since both of them aim at increase the diversity of deep features.…”
Section: Other Classification Methodsmentioning
confidence: 99%
“…A superpixel-guided layer-wise embedding CNN based approach is introduced by [46] to exploit information from both labeled and unlabeled examples. The work of [29] introduced a center-based structured metric learning approach where both deep metrics and center points are taken into account to penalize pairwise correlation and class-wise information between categories. Most of these approaches employ CNN models trained using RGB patches as input.…”
Section: Related Workmentioning
confidence: 99%